Scanning Electron Microscopy (SEM)

A scanning electron microscope (SEM) can scan the surface of a sample with a finely focused electron beam to produce an image. The energy exchange between the electron beam and the sample results in emission of electrons which are detected to produce the image. This technique enables detection of features that are 1 nm apart.

1 . 2 . 3 . 4 . 5 . 6 . 7